Hyoseob Kim, Cornelia Boldyreff. A Method to Recover Design Patterns Using Software Product Metrics. In William B. Frakes, editor, Software Reuse: Advances in Software Reusability, 6th International Conerence, ICSR-6, Vienna, Austria, June 27-29, 2000, Proceedings. Volume 1844 of Lecture Notes in Computer Science, pages 318-335, Springer, 2000.
@inproceedings{KimB00:2,
title = {A Method to Recover Design Patterns Using Software Product Metrics},
author = {Hyoseob Kim and Cornelia Boldyreff},
year = {2000},
tags = {design},
researchr = {https://researchr.org/publication/KimB00%3A2},
cites = {0},
citedby = {0},
pages = {318-335},
booktitle = {Software Reuse: Advances in Software Reusability, 6th International Conerence, ICSR-6, Vienna, Austria, June 27-29, 2000, Proceedings},
editor = {William B. Frakes},
volume = {1844},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-67696-1},
}