Byung-gi Kim, Hoon Chang, Jung Wan Cho. Methodology for ensuring high reliability of VLSI systems. Journal of Systems Architecture, 43(1-5):111-117, 1997.
@article{KimCC97,
title = {Methodology for ensuring high reliability of VLSI systems},
author = {Byung-gi Kim and Hoon Chang and Jung Wan Cho},
year = {1997},
tags = {reliability},
researchr = {https://researchr.org/publication/KimCC97},
cites = {0},
citedby = {0},
journal = {Journal of Systems Architecture},
volume = {43},
number = {1-5},
pages = {111-117},
}