Pairwise Test Case Generation Based on Module Dependency

Jangbok Kim, Kyunghee Choi, Gihyun Jung. Pairwise Test Case Generation Based on Module Dependency. IEICE Transactions, 89-D(11):2811-2813, 2006. [doi]

Authors

Jangbok Kim

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Kyunghee Choi

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Gihyun Jung

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