Yeo Myung Kim, Woojun Choi, Jaehoon Kim, Sanghoon Lee, Sangho Lee, Hyeongon Kim, Kofi A. A. Makinwa, Youngcheol Chae, Tae-Wook Kim. 2 embedded temperature sensor with ±2°C inaccuracy for self-refresh control in 25nm mobile DRAM. In Wolfgang Pribyl, Franz Dielacher, Gernot Hueber, editors, st European Solid-State Circuits Conference, Graz, Austria, September 14-18, 2015. pages 267-270, IEEE, 2015. [doi]
@inproceedings{KimCKLLKMCK15,
title = {2 embedded temperature sensor with ±2°C inaccuracy for self-refresh control in 25nm mobile DRAM},
author = {Yeo Myung Kim and Woojun Choi and Jaehoon Kim and Sanghoon Lee and Sangho Lee and Hyeongon Kim and Kofi A. A. Makinwa and Youngcheol Chae and Tae-Wook Kim},
year = {2015},
doi = {10.1109/ESSCIRC.2015.7313878},
url = {http://dx.doi.org/10.1109/ESSCIRC.2015.7313878},
researchr = {https://researchr.org/publication/KimCKLLKMCK15},
cites = {0},
citedby = {0},
pages = {267-270},
booktitle = {st European Solid-State Circuits Conference, Graz, Austria, September 14-18, 2015},
editor = {Wolfgang Pribyl and Franz Dielacher and Gernot Hueber},
publisher = {IEEE},
isbn = {978-1-4673-7472-9},
}