Jae Kwon Kim, Kyu Cheol Cho, Jong Sik Lee, Youngshin Han. Feature Selection Techniques for Improving Rare Class Classification in Semiconductor Manufacturing Process. In Jason J. Jung, PanKoo Kim, editors, Big Data Technologies and Applications - 7th International Conference, BDTA 2016, Seoul, South Korea, November 17-18, 2016, Proceedings. Volume 194 of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, pages 40-47, Springer, 2016. [doi]
@inproceedings{KimCLH16-0,
title = {Feature Selection Techniques for Improving Rare Class Classification in Semiconductor Manufacturing Process},
author = {Jae Kwon Kim and Kyu Cheol Cho and Jong Sik Lee and Youngshin Han},
year = {2016},
doi = {10.1007/978-3-319-58967-1_5},
url = {https://doi.org/10.1007/978-3-319-58967-1_5},
researchr = {https://researchr.org/publication/KimCLH16-0},
cites = {0},
citedby = {0},
pages = {40-47},
booktitle = {Big Data Technologies and Applications - 7th International Conference, BDTA 2016, Seoul, South Korea, November 17-18, 2016, Proceedings},
editor = {Jason J. Jung and PanKoo Kim},
volume = {194},
series = {Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering},
publisher = {Springer},
isbn = {978-3-319-58967-1},
}