Automatic inspection of solder joints using layered illumination

Tae-Hyeon Kim, Tai-Hoon Cho, Young Shik Moon, Sung-Han Park. Automatic inspection of solder joints using layered illumination. In ICIP (2). pages 645-648, 1996. [doi]

Authors

Tae-Hyeon Kim

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Tai-Hoon Cho

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Young Shik Moon

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Sung-Han Park

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