Yunho Kim, Shin Hong. DEMINER: test generation for high test coverage through mutant exploration. Softw. Test., Verif. Reliab., 31(1-2), 2021. [doi]
@article{KimH21-1,
title = {DEMINER: test generation for high test coverage through mutant exploration},
author = {Yunho Kim and Shin Hong},
year = {2021},
doi = {10.1002/stvr.1715},
url = {https://doi.org/10.1002/stvr.1715},
researchr = {https://researchr.org/publication/KimH21-1},
cites = {0},
citedby = {0},
journal = {Softw. Test., Verif. Reliab.},
volume = {31},
number = {1-2},
}