FINE Samples for Learning with Noisy Labels

Taehyeon Kim, Jongwoo Ko, Sangwook Cho, Jinhwan Choi, Se-Young Yun. FINE Samples for Learning with Noisy Labels. In Marc'Aurelio Ranzato, Alina Beygelzimer, Yann N. Dauphin, Percy Liang, Jennifer Wortman Vaughan, editors, Advances in Neural Information Processing Systems 34: Annual Conference on Neural Information Processing Systems 2021, NeurIPS 2021, December 6-14, 2021, virtual. pages 24137-24149, 2021. [doi]

@inproceedings{KimKCCY21,
  title = {FINE Samples for Learning with Noisy Labels},
  author = {Taehyeon Kim and Jongwoo Ko and Sangwook Cho and Jinhwan Choi and Se-Young Yun},
  year = {2021},
  url = {https://proceedings.neurips.cc/paper/2021/hash/ca91c5464e73d3066825362c3093a45f-Abstract.html},
  researchr = {https://researchr.org/publication/KimKCCY21},
  cites = {0},
  citedby = {0},
  pages = {24137-24149},
  booktitle = {Advances in Neural Information Processing Systems 34: Annual Conference on Neural Information Processing Systems 2021, NeurIPS 2021, December 6-14, 2021, virtual},
  editor = {Marc'Aurelio Ranzato and Alina Beygelzimer and Yann N. Dauphin and Percy Liang and Jennifer Wortman Vaughan},
}