Practice Patterns to Improve the Quality of Design Model in Embedded Software Development

Doo-Hwan Kim, Jong-Phil Kim, Jang-Eui Hong. Practice Patterns to Improve the Quality of Design Model in Embedded Software Development. In Byoungju Choi, editor, Proceedings of the Ninth International Conference on Quality Software, QSIC 2009, Jeju, Korea, August 24-25, 2009. pages 179-184, IEEE Computer Society, 2009. [doi]

@inproceedings{KimKH09-0,
  title = {Practice Patterns to Improve the Quality of Design Model in Embedded Software Development},
  author = {Doo-Hwan Kim and Jong-Phil Kim and Jang-Eui Hong},
  year = {2009},
  doi = {10.1109/QSIC.2009.32},
  url = {http://doi.ieeecomputersociety.org/10.1109/QSIC.2009.32},
  tags = {meta-model, embedded software, model-driven development, Meta-Environment, design},
  researchr = {https://researchr.org/publication/KimKH09-0},
  cites = {0},
  citedby = {0},
  pages = {179-184},
  booktitle = {Proceedings of the Ninth International Conference on Quality Software, QSIC 2009, Jeju, Korea, August 24-25, 2009},
  editor = {Byoungju Choi},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3828-0},
}