Hyung Jin Kim, Kwang-Sik Kim, Min-Seok Kim, Jang Hyun Lee. Development of Fault Detection Algorithm using LP Pump Failure Data. In Shusaku Tsumoto, Yukio Ohsawa, Lei Chen 0002, Dirk Van den Poel, Xiaohua Hu 0001, Yoichi Motomura, Takuya Takagi, Lingfei Wu, Ying Xie, Akihiro Abe, Vijay Raghavan 0001, editors, IEEE International Conference on Big Data, Big Data 2022, Osaka, Japan, December 17-20, 2022. pages 1, IEEE, 2022. [doi]
@inproceedings{KimKKL22-2,
title = {Development of Fault Detection Algorithm using LP Pump Failure Data},
author = {Hyung Jin Kim and Kwang-Sik Kim and Min-Seok Kim and Jang Hyun Lee},
year = {2022},
doi = {10.1109/BigData55660.2022.10020512},
url = {https://doi.org/10.1109/BigData55660.2022.10020512},
researchr = {https://researchr.org/publication/KimKKL22-2},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {IEEE International Conference on Big Data, Big Data 2022, Osaka, Japan, December 17-20, 2022},
editor = {Shusaku Tsumoto and Yukio Ohsawa and Lei Chen 0002 and Dirk Van den Poel and Xiaohua Hu 0001 and Yoichi Motomura and Takuya Takagi and Lingfei Wu and Ying Xie and Akihiro Abe and Vijay Raghavan 0001},
publisher = {IEEE},
isbn = {978-1-6654-8045-1},
}