Taeheung Kim, Jong-Seok Lee. BAND: BAgging noise detectors with application to semiconductor wafer denoising. Appl. Soft Comput., 147:110742, November 2023. [doi]
@article{KimL23-37,
title = {BAND: BAgging noise detectors with application to semiconductor wafer denoising},
author = {Taeheung Kim and Jong-Seok Lee},
year = {2023},
month = {November},
doi = {10.1016/j.asoc.2023.110742},
url = {https://doi.org/10.1016/j.asoc.2023.110742},
researchr = {https://researchr.org/publication/KimL23-37},
cites = {0},
citedby = {0},
journal = {Appl. Soft Comput.},
volume = {147},
pages = {110742},
}