Concolic testing for high test coverage and reduced human effort in automotive industry

Yunho Kim, Dongju Lee, Junki Baek, Moonzoo Kim. Concolic testing for high test coverage and reduced human effort in automotive industry. In Helen Sharp, Mike Whalen, editors, Proceedings of the 41st International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2019, Montreal, QC, Canada, May 25-31, 2019. pages 151-160, IEEE / ACM, 2019. [doi]

Authors

Yunho Kim

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Dongju Lee

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Junki Baek

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Moonzoo Kim

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