Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme

Hong Il Kim, Sang Hwa Lee, Nam Ik Cho. Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme. IEEE Signal Process. Lett., 16(5):374-377, 2009. [doi]

Authors

Hong Il Kim

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Sang Hwa Lee

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Nam Ik Cho

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