Fine-Grained Defect Diagnosis for CMOL FPGA Circuits

Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang. Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access, 8:163140-163151, 2020. [doi]

Authors

Jihye Kim

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Hayoung Lee

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Seokjun Jang

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Sungho Kang

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