Flash based SSD Aware Parity Logging for Building Reliable Massive Capacity SSDs

Jaeho Kim, Eunjae Lee, Jung Kyu Park. Flash based SSD Aware Parity Logging for Building Reliable Massive Capacity SSDs. In 2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 2020. pages 1-4, IEEE, 2020. [doi]

Authors

Jaeho Kim

This author has not been identified. Look up 'Jaeho Kim' in Google

Eunjae Lee

This author has not been identified. Look up 'Eunjae Lee' in Google

Jung Kyu Park

This author has not been identified. Look up 'Jung Kyu Park' in Google