Hae-Cheon Kim, Jin Hyeong Park, Dae Won Kim, Jaesung Lee 0001. Multilabel naïve Bayes classification considering label dependence. Pattern Recognition Letters, 136:279-285, 2020. [doi]
@article{KimPKL20,
title = {Multilabel naïve Bayes classification considering label dependence},
author = {Hae-Cheon Kim and Jin Hyeong Park and Dae Won Kim and Jaesung Lee 0001},
year = {2020},
doi = {10.1016/j.patrec.2020.06.021},
url = {https://doi.org/10.1016/j.patrec.2020.06.021},
researchr = {https://researchr.org/publication/KimPKL20},
cites = {0},
citedby = {0},
journal = {Pattern Recognition Letters},
volume = {136},
pages = {279-285},
}