Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip - researchr publication authors

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Kyoung Min Kim, Joong Jo Park, Myung Hyun Song, In-Cheol Kim, Ching Y. Suen. Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip. In Robert Orchard, Chunsheng Yang, Moonis Ali, editors, Innovations in Applied Artificial Intelligence, 17th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2004, Ottawa, Canada, May 17-20, 2004. Proceedings. Volume 3029 of Lecture Notes in Computer Science, pages 341-350, Springer, 2004. [doi]

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