The Inversive Relationship Between Bugs and Patches: An Empirical Study - researchr publication authors

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Jinhan Kim, Jongchan Park, Shin Yoo. The Inversive Relationship Between Bugs and Patches: An Empirical Study. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 314-323, IEEE, 2023. [doi]

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