Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang. A New Low Power Test Pattern Generator for BIST Architecture. IEICE Transactions, 88-C(10):2037-2038, 2005. [doi]
@article{KimSKK05a,
title = {A New Low Power Test Pattern Generator for BIST Architecture},
author = {Kicheol Kim and DongSub Song and Incheol Kim and Sungho Kang},
year = {2005},
doi = {10.1093/ietele/e88-c.10.2037},
url = {http://dx.doi.org/10.1093/ietele/e88-c.10.2037},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/KimSKK05a},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {88-C},
number = {10},
pages = {2037-2038},
}