Kee Sup Kim, Mohammad Tehranipoor. Session Abstract. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 292-293, IEEE Computer Society, 2006. [doi]
@inproceedings{KimT06:0,
title = {Session Abstract},
author = {Kee Sup Kim and Mohammad Tehranipoor},
year = {2006},
doi = {10.1109/VTS.2006.66},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.66},
researchr = {https://researchr.org/publication/KimT06%3A0},
cites = {0},
citedby = {0},
pages = {292-293},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}