Seah Kim, Shin Yoo. Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models. In 2nd IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2021, Madrid, Spain, May 20-21, 2021. pages 80-89, IEEE, 2021. [doi]
@inproceedings{KimY21-6,
title = {Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models},
author = {Seah Kim and Shin Yoo},
year = {2021},
doi = {10.1109/AST52587.2021.00017},
url = {https://doi.org/10.1109/AST52587.2021.00017},
researchr = {https://researchr.org/publication/KimY21-6},
cites = {0},
citedby = {0},
pages = {80-89},
booktitle = {2nd IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2021, Madrid, Spain, May 20-21, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3567-3},
}