Seong Joon Kim, Tao Yuan, Suk Joo Bae. A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides. IEEE Transactions on Reliability, 65(1):263-271, 2016. [doi]
@article{KimYB16,
title = {A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides},
author = {Seong Joon Kim and Tao Yuan and Suk Joo Bae},
year = {2016},
doi = {10.1109/TR.2015.2456183},
url = {http://dx.doi.org/10.1109/TR.2015.2456183},
researchr = {https://researchr.org/publication/KimYB16},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {65},
number = {1},
pages = {263-271},
}