Stereo confidence metrics using the costs of surrounding pixels

Sanghun Kim, Dong-Gon Yoo, Young-Hwan Kim. Stereo confidence metrics using the costs of surrounding pixels. In 19th International Conference on Digital Signal Processing, DSP 2014, Hong Kong, China, August 20-23, 2014. pages 98-103, IEEE, 2014. [doi]

Authors

Sanghun Kim

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Dong-Gon Yoo

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Young-Hwan Kim

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