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Peter D. Kirchner, Matthias Boehm, Berthold Reinwald, Daby M. Sow, Michael Schmidt, Deepak S. Turaga, Alain Biem. Large Scale Discriminative Metric Learning. In 2014 IEEE International Parallel & Distributed Processing Symposium Workshops, Phoenix, AZ, USA, May 19-23, 2014. pages 1656-1663, IEEE, 2014. [doi]

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