Tadashi Kishimoto, Tohru Ishihara, Hidetoshi Onodera. On-chip temperature and process variation sensing using a reconfigurable Ring Oscillator. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{KishimotoIO17,
title = {On-chip temperature and process variation sensing using a reconfigurable Ring Oscillator},
author = {Tadashi Kishimoto and Tohru Ishihara and Hidetoshi Onodera},
year = {2017},
doi = {10.1109/VLSI-DAT.2017.7939649},
url = {https://doi.org/10.1109/VLSI-DAT.2017.7939649},
researchr = {https://researchr.org/publication/KishimotoIO17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017},
publisher = {IEEE},
isbn = {978-1-5090-3969-2},
}