Failure Trace Analysis of Timed Circuits for Automatic Timing Constraints Derivation

Tomoya Kitai, Tomohiro Yoneda, Chris J. Myers. Failure Trace Analysis of Timed Circuits for Automatic Timing Constraints Derivation. IEICE Transactions, 88-D(11):2555-2564, 2005. [doi]

Authors

Tomoya Kitai

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Tomohiro Yoneda

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Chris J. Myers

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