Concurrent Error Detectable Carry Select Adder with Easy Testability

Nobutaka Kito, Naofumi Takagi. Concurrent Error Detectable Carry Select Adder with Easy Testability. IEEE Transactions on Computers, 68(7):1105-1110, 2019. [doi]

@article{KitoT19,
  title = {Concurrent Error Detectable Carry Select Adder with Easy Testability},
  author = {Nobutaka Kito and Naofumi Takagi},
  year = {2019},
  doi = {10.1109/TC.2019.2895074},
  url = {https://doi.org/10.1109/TC.2019.2895074},
  researchr = {https://researchr.org/publication/KitoT19},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Computers},
  volume = {68},
  number = {7},
  pages = {1105-1110},
}