Tobias Koal, Heinrich Theodor Vierhaus. Optimal spare utilization for reliability and mean lifetime improvement of logic built-in self-repair. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 219-224, IEEE, 2011. [doi]
@inproceedings{KoalV11,
title = {Optimal spare utilization for reliability and mean lifetime improvement of logic built-in self-repair},
author = {Tobias Koal and Heinrich Theodor Vierhaus},
year = {2011},
doi = {10.1109/DDECS.2011.5783083},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783083},
researchr = {https://researchr.org/publication/KoalV11},
cites = {0},
citedby = {0},
pages = {219-224},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}