Jumpei Kobashi, Satoshi Yamane, Atsushi Takeshita. Development of SMT-Based Bounded Model Checker for embedded assembly program. In IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014, Tokyo, Japan, 7-10 October 2014. pages 696-698, IEEE, 2014. [doi]
@inproceedings{KobashiYT14,
title = {Development of SMT-Based Bounded Model Checker for embedded assembly program},
author = {Jumpei Kobashi and Satoshi Yamane and Atsushi Takeshita},
year = {2014},
doi = {10.1109/GCCE.2014.7031120},
url = {https://doi.org/10.1109/GCCE.2014.7031120},
researchr = {https://researchr.org/publication/KobashiYT14},
cites = {0},
citedby = {0},
pages = {696-698},
booktitle = {IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014, Tokyo, Japan, 7-10 October 2014},
publisher = {IEEE},
}