μ-Raman spectroscopy for stress analysis in high power silicon devices

Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir. μ-Raman spectroscopy for stress analysis in high power silicon devices. Microelectronics Reliability, 54(9-10):1770-1773, 2014. [doi]

Authors

Thierry Kociniewski

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Jeff Moussodji

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Zoubir Khatir

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