Testing 3G-controlled systems: time to rejoice or time to feel pain?

Tapio Koivukangas. Testing 3G-controlled systems: time to rejoice or time to feel pain?. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1318, IEEE Computer Society, 2003. [doi]

@inproceedings{Koivukangas03,
  title = {Testing 3G-controlled systems: time to rejoice or time to feel pain?},
  author = {Tapio Koivukangas},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631318.pdf},
  tags = {testing},
  researchr = {https://researchr.org/publication/Koivukangas03},
  cites = {0},
  citedby = {0},
  pages = {1318},
  booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-8106-8},
}