Abhishek Koneru, Krishnendu Chakrabarty. Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits. In Houman Homayoun, Baris Taskin, Tinoosh Mohsenin, Weisheng Zhao, editors, Proceedings of the 2019 on Great Lakes Symposium on VLSI, GLSVLSI 2019, Tysons Corner, VA, USA, May 9-11, 2019. pages 457-462, ACM, 2019. [doi]
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