PySE: Automatic Worst-Case Test Generation by Reinforcement Learning

Jinkyu Koo, Charitha Saumya, Milind Kulkarni 0001, Saurabh Bagchi. PySE: Automatic Worst-Case Test Generation by Reinforcement Learning. In 12th IEEE Conference on Software Testing, Validation and Verification, ICST 2019, Xi'an, China, April 22-27, 2019. pages 136-147, IEEE, 2019. [doi]

@inproceedings{KooS0B19,
  title = {PySE: Automatic Worst-Case Test Generation by Reinforcement Learning},
  author = {Jinkyu Koo and Charitha Saumya and Milind Kulkarni 0001 and Saurabh Bagchi},
  year = {2019},
  doi = {10.1109/ICST.2019.00023},
  url = {https://doi.org/10.1109/ICST.2019.00023},
  researchr = {https://researchr.org/publication/KooS0B19},
  cites = {0},
  citedby = {0},
  pages = {136-147},
  booktitle = {12th IEEE Conference on Software Testing, Validation and Verification, ICST 2019, Xi'an, China, April 22-27, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1736-2},
}