Israel Koren, Zahava Koren. Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs. In 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France. pages 166-174, IEEE Computer Society, 1997. [doi]
@inproceedings{KorenK97,
title = {Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs},
author = {Israel Koren and Zahava Koren},
year = {1997},
url = {http://computer.org/proceedings/dft/8168/81680166abs.htm},
tags = {analysis},
researchr = {https://researchr.org/publication/KorenK97},
cites = {0},
citedby = {0},
pages = {166-174},
booktitle = {1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-8186-8168-3},
}