Beam profiling by vibrating knife edge: Implications for near-field optical scanning microscopy

A. Korpel, D. J. Mehrl, S. Samson. Beam profiling by vibrating knife edge: Implications for near-field optical scanning microscopy. Int. J. Imaging Systems and Technology, 2(3):203-208, 1990. [doi]

Authors

A. Korpel

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D. J. Mehrl

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S. Samson

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