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Local binary patterns as a feature descriptor in alignment-free visualisation of metagenomic data

Samaneh Kouchaki, Santosh Tirunagari, Avraam Tapinos, David L. Robertson. Local binary patterns as a feature descriptor in alignment-free visualisation of metagenomic data. In 2016 IEEE Symposium Series on Computational Intelligence, SSCI 2016, Athens, Greece, December 6-9, 2016. pages 1-6, IEEE, 2016. [doi]

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