Andrzej Krasniewski. Evaluation of delay fault testability of LUTs for the enhancement of application-dependent testing of FPGAs. Journal of Systems Architecture, 49(4-6):283-296, 2003. [doi]
@article{Krasniewski03:1,
title = {Evaluation of delay fault testability of LUTs for the enhancement of application-dependent testing of FPGAs},
author = {Andrzej Krasniewski},
year = {2003},
doi = {10.1016/S1383-7621(03)00066-3},
url = {http://dx.doi.org/10.1016/S1383-7621(03)00066-3},
tags = {testing},
researchr = {https://researchr.org/publication/Krasniewski03%3A1},
cites = {0},
citedby = {0},
journal = {Journal of Systems Architecture},
volume = {49},
number = {4-6},
pages = {283-296},
}