Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits - researchr publication authors

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Peter A. Krauss, Kurt Antreich. Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits. In Arndt Bode, Mario Dal Cin, editors, Parallel Computer Architectures: Theory, Hardware, Software, Applications. Volume 732 of Lecture Notes in Computer Science, pages 234-245, Springer, 1993.

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