Shaji Krishnan, Hans G. Kerkhoff. A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 159-164, IEEE Computer Society, 2011. [doi]
@inproceedings{KrishnanK11,
title = {A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses},
author = {Shaji Krishnan and Hans G. Kerkhoff},
year = {2011},
doi = {10.1109/ETS.2011.31},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2011.31},
tags = {testing},
researchr = {https://researchr.org/publication/KrishnanK11},
cites = {0},
citedby = {0},
pages = {159-164},
booktitle = {16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4433-5},
}