John Kriz, Tom Joyner, Ted Wilson, Greg McGraner. Correlated, Real Time Multi-spectral Sensor Test and Evaluation (T&E) in an Installed Systems Test Facility (ISTF) Using High Performance Computing. In Vassil N. Alexandrov, Jack Dongarra, Benjoe A. Juliano, René S. Renner, Chih Jeng Kenneth Tan, editors, Computational Science - ICCS 2001, International Conference, San Francisco, CA, USA, May 28-30, 2001. Proceedings, Part II. Volume 2074 of Lecture Notes in Computer Science, pages 521-530, Springer, 2001. [doi]
@inproceedings{KrizJWM01,
title = {Correlated, Real Time Multi-spectral Sensor Test and Evaluation (T&E) in an Installed Systems Test Facility (ISTF) Using High Performance Computing},
author = {John Kriz and Tom Joyner and Ted Wilson and Greg McGraner},
year = {2001},
url = {http://link.springer.de/link/service/series/0558/bibs/2074/20740521.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KrizJWM01},
cites = {0},
citedby = {0},
pages = {521-530},
booktitle = {Computational Science - ICCS 2001, International Conference, San Francisco, CA, USA, May 28-30, 2001. Proceedings, Part II},
editor = {Vassil N. Alexandrov and Jack Dongarra and Benjoe A. Juliano and René S. Renner and Chih Jeng Kenneth Tan},
volume = {2074},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-42233-1},
}