Morphological Analysis of Binary Scene in APR Integrated Environment

Marek Krótkiewicz, Krystian Wojtkiewicz. Morphological Analysis of Binary Scene in APR Integrated Environment. In Marek Kurzynski, Michal Wozniak, editors, Computer Recognition Systems 3. Volume 57 of Advances in Intelligent and Soft Computing, pages 135-141, Springer, 2009. [doi]

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