Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection

Krzysztof Kryszczuk, Norman Poh. Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2010, San Francisco, CA, USA, 13-18 June, 2010. pages 146-153, IEEE Computer Society, 2010. [doi]

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