Nate Kube, Kevin Yoo, Daniel Hoffman. Automated testing of industrial control devices: the delphi database. In Antonia Bertolino, Howard Foster, J. Jenny Li, editors, Proceedings of the 6th International Workshop on Automation of Software Test, AST 2011, Waikiki, Honolulu, HI, USA, May 23-24, 2011. pages 71-76, ACM, 2011. [doi]
@inproceedings{KubeYH11,
title = {Automated testing of industrial control devices: the delphi database},
author = {Nate Kube and Kevin Yoo and Daniel Hoffman},
year = {2011},
doi = {10.1145/1982595.1982611},
url = {http://doi.acm.org/10.1145/1982595.1982611},
researchr = {https://researchr.org/publication/KubeYH11},
cites = {0},
citedby = {0},
pages = {71-76},
booktitle = {Proceedings of the 6th International Workshop on Automation of Software Test, AST 2011, Waikiki, Honolulu, HI, USA, May 23-24, 2011},
editor = {Antonia Bertolino and Howard Foster and J. Jenny Li},
publisher = {ACM},
isbn = {978-1-4503-0592-1},
}