Valiable frequency characteristics multi-channel on-chip patch-clamp system using 0.18 um CMOS technology

Masahiro Kubo, Taro Kosaka, Takanori Miyawaki, Kota Ito, Nobuhiko Nakano. Valiable frequency characteristics multi-channel on-chip patch-clamp system using 0.18 um CMOS technology. In International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2016, Phuket, Thailand, October 24-27, 2016. pages 1-5, IEEE, 2016. [doi]

@inproceedings{KuboKMIN16,
  title = {Valiable frequency characteristics multi-channel on-chip patch-clamp system using 0.18 um CMOS technology},
  author = {Masahiro Kubo and Taro Kosaka and Takanori Miyawaki and Kota Ito and Nobuhiko Nakano},
  year = {2016},
  doi = {10.1109/ISPACS.2016.7824689},
  url = {http://dx.doi.org/10.1109/ISPACS.2016.7824689},
  researchr = {https://researchr.org/publication/KuboKMIN16},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2016, Phuket, Thailand, October 24-27, 2016},
  publisher = {IEEE},
  isbn = {978-1-5090-0629-8},
}