Parametrical characterization of leakage power in embedded system caches using gated-VSS - researchr publication authors

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Dhireesha Kudithipudi, Eugene John. Parametrical characterization of leakage power in embedded system caches using gated-VSS. In Vojin G. Oklobdzija, editor, Proceedings of the Third IASTED International Conference on Circuits, Signals, and Systems, Marina del Rey, CA, USA, October 24-26, 2005. pages 308-312, IASTED/ACTA Press, 2005.

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