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A Unified, Resilient, and Explainable Adversarial Patch Detector

Vishesh Kumar, Akshay Agarwal 0001. A Unified, Resilient, and Explainable Adversarial Patch Detector. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2025, Nashville, TN, USA, June 11-15, 2025. pages 30387-30397, Computer Vision Foundation / IEEE, 2025. [doi]

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Vishesh Kumar

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Akshay Agarwal 0001

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