Ratnesh Kumar. Fault Detection, Isolation, and Localization in Embedded Control Software. In 2008 IEEE International Symposium on Intelligent Control, ISIC 2008, San Antonio, TX, USA, September 3-5, 2008. pages 25, IEEE, 2008. [doi]
@inproceedings{Kumar08-13,
title = {Fault Detection, Isolation, and Localization in Embedded Control Software},
author = {Ratnesh Kumar},
year = {2008},
doi = {10.1109/ISIC.2008.4635929},
url = {http://dx.doi.org/10.1109/ISIC.2008.4635929},
researchr = {https://researchr.org/publication/Kumar08-13},
cites = {0},
citedby = {0},
pages = {25},
booktitle = {2008 IEEE International Symposium on Intelligent Control, ISIC 2008, San Antonio, TX, USA, September 3-5, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2224-1},
}