An automated approach for locating multiple faulty LUTs in an FPGA

T. Nandha Kumar, Chia Wai Chong. An automated approach for locating multiple faulty LUTs in an FPGA. Microelectronics Reliability, 48(11-12):1900-1906, 2008. [doi]

@article{KumarC08-3,
  title = {An automated approach for locating multiple faulty LUTs in an FPGA},
  author = {T. Nandha Kumar and Chia Wai Chong},
  year = {2008},
  doi = {10.1016/j.microrel.2008.08.001},
  url = {http://dx.doi.org/10.1016/j.microrel.2008.08.001},
  researchr = {https://researchr.org/publication/KumarC08-3},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {48},
  number = {11-12},
  pages = {1900-1906},
}