Approach to Fault Identification for Electronic Products Using Mahalanobis Distance

S. Kumar, T. W. S. Chow, M. Pecht. Approach to Fault Identification for Electronic Products Using Mahalanobis Distance. IEEE T. Instrumentation and Measurement, 59(8):2055-2064, 2010. [doi]

Authors

S. Kumar

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T. W. S. Chow

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M. Pecht

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