Mohit Kumar, Christian Engelmann. Models for Resilience Design Patterns. In 10th IEEE/ACM Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS@SC 2020, Atlanta, GA, USA, November 11, 2020. pages 21-30, IEEE, 2020. [doi]
@inproceedings{KumarE20-1,
title = {Models for Resilience Design Patterns},
author = {Mohit Kumar and Christian Engelmann},
year = {2020},
doi = {10.1109/FTXS51974.2020.00008},
url = {https://doi.org/10.1109/FTXS51974.2020.00008},
researchr = {https://researchr.org/publication/KumarE20-1},
cites = {0},
citedby = {0},
pages = {21-30},
booktitle = {10th IEEE/ACM Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS@SC 2020, Atlanta, GA, USA, November 11, 2020},
publisher = {IEEE},
isbn = {978-0-7381-1080-6},
}